Meet Associate Prof. Sargunam Thirugnanam
Associate Prof. Sargunam Thirugnanam
Registrar
Assoc. Prof. Sargunam Thirugnanam has more than 25 years of experience in education and training industries. He has held various senior management positions responsible for academics, quality, examination and academic administration in private higher educational institutions. He has been instrumental in developing the twinning and franchise programme arrangement with some of the British Universities. He is the professional fellow of British Computer Society (UK) and active member of Engineering Council (UK).
PROFESSIONAL QUALIFICATIONS AND AFFILIATIONS
• CEng (UK) – Chartered Engineer, Engineering Council, UK
• FBCS (UK) – The Professional Fellow of BCS – British Computer Society, The Chartered Institute for IT, UK
• SMIEEE – Senior Member of IEEE – The Institute of Electrical and Electronics Engineers, USA
• Executive Council Member of IEEE SMC – Malaysia Chapter
• Professional Member of PMI – Project Management Institute, USA
Degrees and ALMA maters
- Master of Business Administration, Madurai Kamaraj University, India
- Master of Science in Computer Science, Guru Ghasidas University, India
- Bachelor of Science in Computer Technology, Government College of Technology, Bharathiar University, India
Select Publications
- High Performance Data Aware (HPDA) SRAM cell for IoT applications, ARPN Journal of Engineering and Applied Sciences. Vol. 14, no. 1, pp. 91-94, 2019
- Reliable Data Aware SRAM Cell using FinFET Technology, ARPN Journal of Engineering and Applied Sciences. Vol.14, no.8, pp. 292-299, 2019
- Design of High Performance FinFET SRAM Cell for Write Operation, Emerging Trends in Computing and Expert Technology (COMET 2019), Springer Publications, pp. 214-220, 2019
- Low Power Data Aware (LPDA) FinFET SRAM Cell for Internet-of-Things (IoT) Applications, International Conference on Contemporary Issues 2019
- Reliable fast SOI SRAM cell for IoT Applications, 4th Electronic and Green Materials International Conference 2018 (EGM 2018) By American Institute of Physics, AIP Conf. Proc. 2045, pp.020107-1–7, 2018